An SPIE Member for 10 years, Puente León was an SPIE author and served as chair for the Automated Visual Inspection and Machine Vision conference at SPIE Optical Metrology.
Prof. Puente León had been director of the Industrial Information Technology Institute at KIT since 2008 and significantly shaped the organization during this time. Under his leadership, numerous research projects and doctorates were carried out on a wide range of topics in signal and image processing, measurement technology, and human-machine interaction.
While teaching at the KIT, he was responsible for several events, including "Signals and Systems" and "Measurement Technology."
In addition to KIT, he enjoyed an excellent reputation as a committed scientist, as the editor of the journal tm-Technisches Messen and as the author and co-author of several textbooks.