Past Event Overview

Thank you to all of those who participated at SPIE Optical Metrology, the premier European conference to meet with scientists, engineers, researchers, and product developers to discuss the latest research in measurement systems, modeling, videometrics, and inspection.

Review the 2015 Programme
Onsite news and photos
Final Technical Programme (2 MB PDF)
Technical Abstracts (1 MB PDF)
2015 Plenary Session
 

Extreme Computational Imaging: Pohography, Health-tech and Displays 
Ramesh Raskar
MIT Media Lab,
USA

2015 Conference Topics:
Optical Measurement Systems for Industrial Inspection
Modeling Aspects in Optical Metrology
O3A: Optics for Arts, Architecture, and Archaeology
Videometrics, Range Imaging, and Applications
Optical Methods for Inspection, Characterization, and Imaging of Biomaterials
Automated Visual Inspection and Machine Vision


SPIE Optical Metrology is part of: