Past Event Overview
SPIE Europe Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.
Co-located with LASER 2009, World of Photonics in Munich, Germany, the symposium addressed the role of lasers in the following areas:
- Optical Measurement Systems for Industrial Inspection
- Modeling Aspects in Optical Metrology
- O3A: Optics for Arts, Architecture, and Archaeology
Learn more about the 2009 event:
- Download the Final Programme (PDF)
- View the Invitation from Chairs
- See the full list of Participants
Symposium Chairs
Wolfgang Osten, Univ. Stuttgart (Germany)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
Pietro Ferraro, Istituto Nazionale di Ottica Applicata (Italy)